Guest Speaker: Professor Carlos F.O. Graeff (Departamento de FísicaUniversidade Estadual Paulista Júlio de Mesquita Filho, Faculdade de Ciências de Bauru, SP – Brasil)

Time: 2014-12-19 (Friday), 14：30 - 15：30
Location: Conference Room, Institute of Optoelectronic Technology

Abstract

Magnetic resonance techniques attract considerable attention in many research fields. Advantages compared to other techniques are among others, high sensitivity and selectivity. In general, the technique can be used to investigate local static and dynamic interactions, or in other words the microscopic surroundings of the spin. Among MR techniques Electrically Detected Magnetic Resonance (EDMR) is a powerful tool for materials and electronic device characterization. In this talk, we shall present a short review on the use of EDMR in different semiconductors: a-Si(Ge):H, Si/SiGeheterostructures and Alq₃ based OLEDs. We will also present a brief introduction to the fundamental concepts of the technique.